The effect of ion beam cleaning on the laser films is investigated. 研究了用离子束清洗基片时对薄膜抗激光损伤阈值的作用。
Using End-Hall ion source, the application of ion beam cleaning on the laser films is investigated. 介绍了在激光薄膜中EndHall型离子源离子束清洗的应用。
The observation that the Auger signals of the individual composition and conductivity samples, after a bombardment of ion beam cleaning, vary with the bombardment of electron beam analyzing is described. 观察分析了成分和导电性不同的样品经离子束轰击清洗表面后,在AES的探针电子束连续轰击下,表面俄歇信号的峰形变化。
The application of ion beam cleaning on the laser films 离子束清洗在激光薄膜中的应用